Publications

29 results at IEEE Design and Test of Computers

The dawn of predictive chip yield design: Along and beyond the memory lane
- - Rajiv Joshi
  - Rouwaida Kanj
  - et al.
- 2010
- IEEE Design and Test of Computers
Compact modeling of variation in FinFET SRAM cells
- - Darsen D. Lu
  - Chung-Hsun Lin
  - et al.
- 2010
- IEEE Design and Test of Computers
Reliability challenges and system performance at the architecture level
- - Jude A. Rivers
  - Prabhakar Kudva
- 2009
- IEEE Design and Test of Computers
Opportunities and challenges for 3D systems and their design
- - Philip Emma
  - Eren Kursun
- 2009
- IEEE Design and Test of Computers
Embedded systems week
- - Reinaldo A. Bergamaschi
- 2007
- IEEE Design and Test of Computers
Quiescent-signal analysis: A multiple supply pad /_DDQ method
- - Jim Plusquellic
  - Dhruva Acharyya
  - et al.
- 2006
- IEEE Design and Test of Computers
On-chip testing techniques for RF wireless transceivers
- - Alberto Valdes-Garcia
  - Jose Silva-Martinez
  - et al.
- 2006
- IEEE Design and Test of Computers
Jitter measurements of high-speed serial links
- - Marcel A. Marcel
  - Martin L. Schmatz
- 2004
- IEEE Design and Test of Computers
Impact of design-manufacturing interface on SoC design methodologies
- - Juan-Antonio Carballo
  - Sani R. Nassif
- 2004
- IEEE Design and Test of Computers
Genesys-Pro: Innovations in test program generation for functional processor verification
- - Allon Adir
  - Eli Almog
  - et al.
- 2004
- IEEE Design and Test of Computers