Christian Kromer, Gion Sialm, et al.
IEEE Journal of Solid-State Circuits
Paper
Jitter measurements of high-speed serial links
Abstract
Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.
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