Philip G. Emma, Eren Kursun
IBM J. Res. Dev
Editor's note article presents the system design opportunities offered by 3D integration, and it discusses the design and test challenges for 3D ICs, with various new design-for-manufacture and DFT issues. © 2009 IEEE.
Philip G. Emma, Eren Kursun
IBM J. Res. Dev
Víctor Jiménez, Francisco J. Cazorla, et al.
IEEE Micro
Eren Kursun, Chen-Yong Cher
ICCD 2008
Guangyu Sun, Eren Kursun, et al.
ICCD 2011