Sriramkumar Venugopalan, Muhammed A. Kari, et al.
SISPAD 2012
Paper
Compact modeling of variation in FinFET SRAM cells
Abstract
Editor's note: FinFET technology is a possible solution to achieve a better power/performance trade-off for SRAM cells. This article provides a comprehensive analysis of the variations in FinFET devices, their impact on SRAM stability, and a statistical design procedure for FinFET SRAM cells. © 2010 IEEE.
Related
Chung-Hsun Lin, Wilfried Haensch, et al.
VLSI Technology 2011
Qing Cao, Shu-Jen Han, et al.
Nature Nanotechnology
Conference paper
A comparative study of fin-last and fin-first SOI FinFETs
Darsen Lu, Josephine Chang, et al.
SISPAD 2013