An Integrated Environment for Technology Closure of Deep-Submicron IC Designs
- Louise Trevillyan
- David Kung
- et al.
- 2004
- IEEE Design and Test of Computers
Paper
Publications
29 results at IEEE Design and Test of Computers
A clockless future for systems on chip
- Suhwan Kim
- Conrad H. Ziesler
- 2003
- IEEE Design and Test of Computers
ReviewAutomating the design of SOCs using cores
- Reinaldo A. Bergamaschi
- Subhrajit Bhattacharya
- et al.
- 2001
- IEEE Design and Test of Computers
PaperAre Single-Chip Multiprocessors in Reach?
- Reinaldo Bergamaschi
- Ivo Bolsens
- et al.
- 2001
- IEEE Design and Test of Computers
PaperDesign methodology for a large communication chip
- Rolf Clauberg
- Peter Buchmann
- et al.
- 2000
- IEEE Design and Test of Computers
PaperMeasuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
- Keith A. Jenkins
- James P. Eckhardt
- 2000
- IEEE Design and Test of Computers
PaperConquering noise in deep-submicron digital ICs
- Kenneth L. Shepard
- Vinod Narayanan
- 1998
- IEEE Design and Test of Computers
PaperConcurrent checking of clock signal correctness
- Cecilia Metra
- Michele Favalli
- et al.
- 1998
- IEEE Design and Test of Computers
ReviewDetecting and preventing measurement errors
- Keith A. Jenkins
- 1997
- IEEE Design and Test of Computers
PaperObservable time windows: Verifying high-level synthesis results
- Reinaldo A. Bergamaschi
- Salil Raje
- 1997
- IEEE Design and Test of Computers
Paper