Shu-Jen Han, Satoshi Oida, et al.
DRC 2013
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Shu-Jen Han, Satoshi Oida, et al.
DRC 2013
Saibal Mukhopadhyay, Keunwoo Kim, et al.
IEEE Journal of Solid-State Circuits
Keith A. Jenkins, Anup P. Jose, et al.
ESSCIRC 2005
Keith A. Jenkins, Chirag S. Patel
IITC 2005