Joyce H. Wu, Jesds A. Del Alamo, et al.
Technical Digest - International Electron Devices Meeting
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Joyce H. Wu, Jesds A. Del Alamo, et al.
Technical Digest - International Electron Devices Meeting
John U. Knickerbocker, Paul S. Andry, et al.
IBM J. Res. Dev
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Journal of Applied Physics
Han-Su Kim, Keith A. Jenkins, et al.
IEEE Electron Device Letters