Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

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Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

Conference paper

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators

Jente B. Kuang, Keith A. Jenkins, et al.

ESSCIRC 2013

Conference paper

On-chip circuit for monitoring frequency degradation due to NBTI

Kevin Stawiasz, Keith A. Jenkins, et al.

IRPS 2008

Paper

Corroborating Cutoff Frequency Measurements with DC Gain Measurements

Keith A. Jenkins

IEEE Trans. Instrum. Meas.

Paper

Reduction of Hot Carrier Degradation of FinFETs Due to Short-Pulse Stress

Keith A. Jenkins, Barry P. Linder

IEEE Electron Device Letters

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Abstract

Related

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators

On-chip circuit for monitoring frequency degradation due to NBTI

Corroborating Cutoff Frequency Measurements with DC Gain Measurements

Reduction of Hot Carrier Degradation of FinFETs Due to Short-Pulse Stress