Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
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