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Conference paperOccupancy sampling for terabit CEE switchesFredy D. Neeser, Nikolaos I. Chrysos, et al.HOTI 2012
PaperMicrofields in stroboscopic voltage measurements via electron emission. I. Response function of the potential energyRolf ClaubergJournal of Applied Physics
PaperHigh electron density effects in electron spectroscopies: Consequences for picosecond photoemission and electron-beam samplingRolf Clauberg, Armin BlachaJournal of Applied Physics