Past, present, and future of backscatter electron (BSE) imaging
- Oliver C. Wells
- Michael S. Gordon
- et al.
- 2012
- ScMi 2012
Conference paper
Publications
52 results for O.C. Wells
Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
PaperIon damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
PaperReduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
PaperEnhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in technique
- O.C. Wells
- R.J. Savoy
- 2011
- Scanning
PaperStudies of contamination build up in the SEM using the bse imaging technique
- O.C. Wells
- C.F. Aliotta
- 2011
- Scanning
PaperEffects of collector take‐off angle and energy filtering on the BSE image in the SEM
- Oliver C. Wells
- 2011
- Scanning
ReviewRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field
- Oliver C. Wells
- Catherine A. Stoye
- 2011
- Journal of Microscopy
PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2011
- Journal of Microscopy
Paper