PaperRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic fieldOliver C. Wells, Catherine A. StoyeJournal of Microscopy
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
