PaperAn electron microscope investigation of the effect of phosphorous doping on the plasma etching of polycrystalline siliconE.A. Irene, E. Tierney, et al.JES
PaperVoltage measurement in the scanning electron microscopeO.C. Wells, C.G. BremerJournal of Physics E: Scientific Instruments
Conference paperMEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON MICROSCOPE.O.C. Wells, P. Coane, et al.Microbeam Analysis 1982
