Conference paperStudies of poorly conducting samples by the low-loss electron method in the scanning electron microscopeO.C. Wells, S. RishtonMSA Annual Meeting 1994
PaperEnhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in techniqueO.C. Wells, R.J. SavoyScanning
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lensO.C. WellsScanning
Conference paperIn-lens magnetically filtered detector for scanning electron microscopeO.C. Wells, E. Munro, et al.Institute of Physics Electron Microscopy and Analysis Group Conference 1991
