Paper

05 Oct 2011

Penetration effect at sharp edges in the scanning electron microscope

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Abstract

No abstract available.

Paper

Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)

O.C. Wells, A.N. Broers, et al.

Applied Physics Letters

Conference paper

Explanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical review

O.C. Wells

MSA Annual Meeting 1993

Conference paper

MEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON MICROSCOPE.

O.C. Wells, P. Coane, et al.

Microbeam Analysis 1982

Paper

Studies of samples having shallow surface topography by the low-loss electron (LLE) method in the scanning electron microscope (SEM)

O.C. Wells, Maurice McGlashen-Powell, et al.

Scanning

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