PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lensO.C. WellsScanning
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
PaperAutomatic Positioning of Device Electrodes Using the Scanning Electron MicroscopeO.C. Wells, T.E. Everhart, et al.IEEE T-ED
PaperStudies of contamination build up in the SEM using the bse imaging techniqueO.C. Wells, C.F. AliottaScanning