N.G. Ainslie, F.M. D'Heurle, et al.
Applied Physics Letters
Paper
Penetration effect at sharp edges in the scanning electron microscope
Abstract
No abstract available.
Related
O.C. Wells, C.G. Bremer
Journal of Physics E: Scientific Instruments
O.C. Wells, S. Rishton
MSA Annual Meeting 1994
L. Gignac, O.C. Wells, et al.
Microscopy and Microanalysis