Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Paper

Low-loss electron images of uncoated photoresist in the scanning electron microscope

Oliver C. Wells

Applied Physics Letters

Paper

Magnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In Technique

Oliver C. Wells, Richard J. Savoy

IEEE Transactions on Magnetics

Paper

Top-down topography of deeply etched silicon in the scanning electron microscope

Oliver C. Wells, Conal E. Murray, et al.

Review of Scientific Instruments

Paper

Reduction of edge penetration effect in the scanning electron microscope

Oliver C. Wells

Scanning

View all publications