Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Reduction of edge penetration effect in the scanning electron microscope

Oliver C. Wells

Scanning

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

Oliver C. Wells, Ping-Chin Cheng

Journal of Applied Physics

Conference paper

Past, present, and future of backscatter electron (BSE) imaging

Oliver C. Wells, Michael S. Gordon, et al.

ScMi 2012

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