Does line edge roughness matter?: FEOL and BEOL perspectives
- Qinghuang Lin
- Chuck Black
- et al.
- 2003
- Microlithography 2003
Publications
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86 results for Phil Oldiges
Electrostatic analysis of carbon nanotube arrays
- Xinlin Wang
- H.-S. Wong
- et al.
- 2003
- SISPAD 2003
Gate capacitance optimization for arrays of carbon nanotube field-effect transistors
- Xinlin Wang
- H.-S. Wong
- et al.
- 2003
- Device Research Conference 2003
Strained Si CMOS (SS CMOS) technology: Opportunities and challenges
- K. Rim
- R. Anderson
- et al.
- 2003
- Solid-State Electronics
A simulation study on thin SOI bipolar transistors with fully or partially depleted collector
- Qiqing Ouyang
- Jin Cai
- et al.
- 2002
- BCTM 2002
On the optimal shape and location of silicided source and drain contacts
- P. Oldiges
- C.S. Murthy
- et al.
- 2002
- SISPAD 2002
Technology modeling for emerging SOI devices
- M. Ieong
- P. Oldiges
- 2002
- SISPAD 2002
Soft error rate scaling for emerging SOI technology options
- P. Oldiges
- K. Bernstein
- et al.
- 2002
- VLSI Technology 2002
Fully-depleted-collector polysilicon-emitter SiGe-base vertical bipolar transistor on SOI
- Jin Cai
- A. Ajmera
- et al.
- 2002
- VLSI Technology 2002
Chip Power-Frequency Scaling in 10/7nm Node
- Phil Oldiges
- Reinaldo A. Vega
- et al.
- 2020
- IEEE Access