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Multi-bit upsets in 65nm SOI SRAMs
Abstract
We study multi-bit upsets (MBU) in 65nm SOI SRAMs. Proton beam and thorium foil experiments demonstrate that SOI SRAMs have lower soft error rate than bulk SRAMs. Monte Carlo SER simulations show that SOI SRAMs have a lower fraction of MBU than bulk SRAMs. The probability of MBU correlates with the spacing of sensitive devices in neighboring cells. © 2008 IEEE.
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