Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
G. Ramalingam
Theoretical Computer Science
Leo Liberti, James Ostrowski
Journal of Global Optimization
Beomseok Nam, Henrique Andrade, et al.
ACM/IEEE SC 2006