Paul J. Steinhardt, P. Chaudhari
Journal of Computational Physics
We address in this report a set of key questions tied to the implementation of liquid immersion lithography, from the perspective of the resist materials. We discuss the broad question of whether chemically amplified resists are capable of achieving the spatial resolution that ultimately will be required for the most advanced immersion scenario. Initial studies undertaken using model 193 nm resist materials provide some insight into how an aqueous liquid immersion process can affect the resist material.
Paul J. Steinhardt, P. Chaudhari
Journal of Computational Physics
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Kaushal Patel, Margaret Lawson, et al.
Microlithography 2004
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007