Conference paper
Performance of multilayer dispersion elements from 80 to 500 ev
R.J. Bartlett, D.R. Kania, et al.
Proceedings of SPIE 1989
X-ray micrographs of biological materials have been obtained with a resolution better than 100 angstroms by using x-ray resist as the recording medium. A high-resolution scanning electron microscope with a short-focal-length final lens, operating in the "low-loss" mode, is used to make the smallest features in the x-ray replica visible.
R.J. Bartlett, D.R. Kania, et al.
Proceedings of SPIE 1989
E. Spiller, Alan E. Rosenbluth
Opt. Eng.
H.J. Voorma, E. Louis, et al.
Journal of Applied Physics
E. Spiller, R. Feder, et al.
Science