Conference paper
Performance of multilayer dispersion elements from 80 to 500 ev
R.J. Bartlett, D.R. Kania, et al.
Proceedings of SPIE 1989
X-ray micrographs of biological materials have been obtained with a resolution better than 100 angstroms by using x-ray resist as the recording medium. A high-resolution scanning electron microscope with a short-focal-length final lens, operating in the "low-loss" mode, is used to make the smallest features in the x-ray replica visible.
R.J. Bartlett, D.R. Kania, et al.
Proceedings of SPIE 1989
R. Feder, E. Spiller, et al.
Polymer Engineering & Science
E. Spiller, D.E. Eastman, et al.
Journal of Applied Physics
E. Spiller, R. Feder, et al.
Physics in Technology