R. Feder, J.S. Pearlman, et al.
Journal of Microscopy
In this review of recent progress in lithography and microscopy by X-rays the authors show how X-ray lithography is used to replicate microcircuit patterns with dimensions below 1 mu m, and how these advances have improved the older technique of X-ray microradiography.
R. Feder, J.S. Pearlman, et al.
Journal of Microscopy
S. Mader, R. Feder, et al.
Thin Solid Films
R. Feder, E. Spiller, et al.
Polymer Engineering & Science
J. Kenney, J. Kirz, et al.
Nuclear Instruments and Methods In Physics Research