E. Spiller, R. Feder, et al.
Physics in Technology
The damage tracks of high energy ions in dielectric materials can be etched until overlapping conical etch pits are obtained. If the depth of the pits is > λ/2, an effective graded-index layer with very low reflectivity is obtained. Broadband antireflection treatment achieving reflectivities of <10-4 has been applied to plastics like Lexan and Mylar. © 1980, Optical Society of America.
E. Spiller, R. Feder, et al.
Physics in Technology
E. Spiller, Alan E. Rosenbluth
Opt. Eng.
D. Sayre, J. Kirz, et al.
Ultramicroscopy
L. Golub, A. Quillen, et al.
Proceedings of SPIE 1989