Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Paper
Transmission electron microscopy of wear tracks
Abstract
No abstract available.
Related
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Lawrence Suchow, Norman R. Stemple
JES