Low energy proton single-event-upset test results on 65 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2008
- IEEE TNS
Paper
Publications
126 results for Ken Rodbell
Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Conference paperSingle-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
PaperNew simulation methodology for effects of radiation in semiconductor chip structures
- Henry H.K. Tang
- Conal E. Murray
- et al.
- 2008
- IBM J. Res. Dev
ReviewAlpha-particle-induced upsets in advanced CMOS circuits and technology
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
ReviewImportance of BEOL modeling in single event effect analysis
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2007
- IEEE TNS
PaperLatch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
PaperLow-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2007
- IEEE TNS
PaperProtecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
Conference paperReliability of Cu interconnects with Ta implant
- J.P. Gambino
- T.D. Sullivan
- et al.
- 2007
- IITC 2007
Conference paper