S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
We introduce a planar, triple-self-aligned double-gate FET structure ("PAGODA"). Device fabrication incorporates wafer bonding, front-end CMP, mixed optical/ebeam lithography, silicided silicon source/drain sidewalls, and back gate undercut and passivation. We demonstrate double-gate FET operation with good transport at both interfaces, inverter action, and NOR logic.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
J.C. Marinace
JES
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997