Sung Ho Kim, Oun-Ho Park, et al.
Small
We introduce a planar, triple-self-aligned double-gate FET structure ("PAGODA"). Device fabrication incorporates wafer bonding, front-end CMP, mixed optical/ebeam lithography, silicided silicon source/drain sidewalls, and back gate undercut and passivation. We demonstrate double-gate FET operation with good transport at both interfaces, inverter action, and NOR logic.
Sung Ho Kim, Oun-Ho Park, et al.
Small
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
A. Gangulee, F.M. D'Heurle
Thin Solid Films
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B