On the Removal of Insulator Process Induced Radiation Damage from Insulated Gate Field Effect Transistors at Elevated Pressure

R.D. Murphy, R.O. Watts

Journal of Low Temperature Physics

J.H. Kaufman, Owen R. Melroy, et al.

Synthetic Metals

Daniel J. Coady, Amanda C. Engler, et al.

ACS Macro Letters

T. Schneider, E. Stoll

Physical Review B