S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
In chemically amplified resists, relief image formation strongly depends on the chemistry occurring during the post-exposure bake step. By combining experimental measurements and kinetics simulations, we propose a reaction mechanism describing both acid-catalyzed and uncatalyzed thermolysis routes leading to changes in polymer solubility. The temperature-dependent kinetic parameters derived here provide guidance in CA resist process and materials design. © 1995 Elsevier Science B.V. All rights reserved.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics