Ion damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
Paper
Publications
20 results at Scanning
Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
PaperA wet‐cell for soft x‐ray imaging of hydrated biological specimens
- B.J. Panessa
- G. Colemann
- et al.
- 2011
- Scanning
PaperA circuit for voltage coding synchronizing
- M.J. Immediato
- Keith A. Jenkins
- 2011
- Scanning
PaperSecondary electron detection systems for quantitative voltage measurements
- E. Menzel
- E. Kubalek
- 2011
- Scanning
ReviewReduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
PaperQuantitative image mode voltage contrast
- Keith A. Jenkins
- 2011
- Scanning
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
PaperElectron beam testing of circuits at liquid nitrogen temperature
- Keith A. Jenkins
- M.J. Immediato
- et al.
- 2011
- Scanning
PaperStudies of contamination build up in the SEM using the bse imaging technique
- O.C. Wells
- C.F. Aliotta
- 2011
- Scanning
Paper