Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
Paper
Publications
20 results at Scanning
Ion damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
PaperA wet‐cell for soft x‐ray imaging of hydrated biological specimens
- B.J. Panessa
- G. Colemann
- et al.
- 2011
- Scanning
PaperA circuit for voltage coding synchronizing
- M.J. Immediato
- Keith A. Jenkins
- 2011
- Scanning
PaperSecondary electron detection systems for quantitative voltage measurements
- E. Menzel
- E. Kubalek
- 2011
- Scanning
ReviewScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
PaperEnhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in technique
- O.C. Wells
- R.J. Savoy
- 2011
- Scanning
PaperA semiautomated image analysis procedure for the quantification of dental microwear
- P.S. Ungar
- J.‐C. Simon
- et al.
- 2011
- Scanning
PaperReduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
PaperQuantitative image mode voltage contrast
- Keith A. Jenkins
- 2011
- Scanning
Paper