PaperPerformance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillatorChih-Hsiang Ho, Keith A. Jenkins, et al.IEEE T-ED
PaperOn-chip circuit to monitor long-term NBTI and PBTI degradationKeith A. Jenkins, Pong-Fei LuMicroelectronics Reliability
PaperDevelopment of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnectionJohn U. Knickerbocker, Paul S. Andry, et al.IBM J. Res. Dev
Conference paperA scalable, digital BIST circuit for measurement and compensation of static phase offsetKeith A. Jenkins, Lionel LiVTS 2009
