High performance and reliable strained SiGe PMOS FinFETs enabled by advanced gate stack engineering
- Pouya Hashemi
- Takashi Ando
- et al.
- 2017
- IEDM 2017
Conference paper
Publications
Integrated dual SPE processes with low contact resistivity for future CMOS technologies
- Heng Wu
- Soon-Cheon Seo
- et al.
- 2017
- IEDM 2017
Conference paper20 Years of Cu BEOL in manufacturing, and its future prospects
- Daniel C. Edelstein
- 2017
- IEDM 2017
Conference paperFully aligned via integration for extendibility of interconnects to beyond the 7 nm node
- Benjamin D. Briggs
- C.B. Peethala
- et al.
- 2017
- IEDM 2017
Conference paperNet-Trim: Convex pruning of deep neural networks with performance guarantee
- Alireza Aghasi
- Afshin Abdi
- et al.
- 2017
- NeurIPS 2017
Conference paperSemi-supervised learning with GANs: Manifold invariance with improved inference
- Abhishek Kumar
- Prasanna Sattigeri
- et al.
- 2017
- NeurIPS 2017
Conference paperEfficient use of limited-memory accelerators for linear learning on heterogeneous systems
- Celestine Mendler-Dünner
- Thomas Parnell
- et al.
- 2017
- NeurIPS 2017
Conference paperImproved dynamic regret for non-degenerate functions
- Lijun Zhang
- Tianbao Yang
- et al.
- 2017
- NeurIPS 2017
Conference paperCan decentralized algorithms outperform centralized algorithms? A case study for decentralized parallel stochastic gradient descent
- Xiangru Lian
- Ce Zhang
- et al.
- 2017
- NeurIPS 2017
Conference paperModel-powered conditional independence test
- Rajat Sen
- Ananda Theertha Suresh
- et al.
- 2017
- NeurIPS 2017
Conference paper