Imaging of ferroelectric domain walls by force microscopy
- F. Saurenbach
- B.D. Terris
- 1990
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Material properties of p-type GaAs at large dopings
- Sandip Tiwari
- Steven L. Wright
- 1990
- Applied Physics Letters
PaperAnnealing behavior of GaAs implanted with Si+ and SiF + and rapid thermally annealed with plasma-enhanced chemical vapor deposited silicon nitride cap
- J.P. De Souza
- D.K. Sadana
- et al.
- 1990
- Applied Physics Letters
PaperTheory of magnetic force microscope images
- David W. Abraham
- F. Alan McDonald
- 1990
- Applied Physics Letters
PaperNanometer resolution in luminescence microscopy of III-V heterostructures
- D.L. Abraham
- A. Veider
- et al.
- 1990
- Applied Physics Letters
PaperUltrafast time resolution in scanned probe microscopies
- R.J. Hamers
- David G. Cahill
- 1990
- Applied Physics Letters
PaperAnalysis of buried GaAs layers in 〈100〉 silicon by electron energy loss spectroscopy, Rutherford backscattering spectroscopy, and ion channeling
- Peter Madakson
- John Bruley
- 1990
- Applied Physics Letters
PaperGiant microwave losses in a YBaCuO bicrystal
- E.J. Pakulis
- S.E. Blum
- 1990
- Applied Physics Letters
PaperFractional states in few-electron systems
- W. Hansen
- T.P. Smith III
- et al.
- 1990
- Applied Physics Letters
PaperReaction between Cu and TiSi2 across different barrier layers
- Chin-An Chang
- Chao-Kun Hu
- 1990
- Applied Physics Letters
Paper