A. Zaslavsky, D.A. Grützmacher, et al.
Surface Science
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
A. Zaslavsky, D.A. Grützmacher, et al.
Surface Science
C.-K. Hu, K.P. Rodbell, et al.
IBM J. Res. Dev
S.J. Koester, K. Ismail, et al.
Applied Physics Letters
T.P. Smith III, K.Y. Lee, et al.
Physical Review B