S. Washburn, K. Ismail, et al.
Quantum Effect Physics, Electronics and Applications 1992
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
S. Washburn, K. Ismail, et al.
Quantum Effect Physics, Electronics and Applications 1992
C. Stebler, M. Despont, et al.
Microelectronic Engineering
C.-K. Hu, K.Y. Lee, et al.
JES
C.-K. Hu, R. Rosenberg, et al.
Applied Physics Letters