PaperA differential interferometer for force microscopyC. Schönenberger, S.F. AlvaradoReview of Scientific Instruments
PaperUnderstanding magnetic force microscopyC. Schönenberger, S.F. AlvaradoZeitschrift für Physik B Condensed Matter
PaperObservation of single charge carriers by force microscopyC. Schönenberger, S.F. AlvaradoPhysical Review Letters
PaperSeparation of magnetic and topographic effects in force microscopyC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics