PaperObservation of single charge carriers by force microscopyC. Schönenberger, S.F. AlvaradoPhysical Review Letters
PaperA differential interferometer for force microscopyC. Schönenberger, S.F. AlvaradoReview of Scientific Instruments
PaperUnderstanding magnetic force microscopyC. Schönenberger, S.F. AlvaradoZeitschrift für Physik B Condensed Matter
PaperScanning tunneling microscopy as a tool to study surface roughness of sputtered thin filmsC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics