Publications

22 results for Joseph Angilello

Preparation and Characterization of Ruthenium Dioxide Crystals
- - M.W. Shafer
  - R.A. Figat
  - et al.
- 2019
- JES
A Viscous Flow Model to Explain the Appearance of High Density Thermal Si02 at Low Oxidation Temperatures
- - E. Tierney
  - J. Angilello
- 2019
- JES
Etch pits and dislocations in {100} GaAs wafers
- - J. Angilello
  - R.M. Potemski
  - et al.
- 2008
- Journal of Applied Physics
Contact reaction between Si and Pd-W alloy films
- - J.O. Olowolafe
  - K.N. Tu
  - et al.
- 2008
- Journal of Applied Physics
Electromechanical feedback control for lang topography
- - Joseph Angilello
  - Clinton Wood
- 2003
- Review of Scientific Instruments
The interpretation of dislocation contrast in x-ray topographs of GaAs _1-x P_x
- - S. Mader
  - A.E. Blakeslee
  - et al.
- 2003
- Journal of Applied Physics
Thermal stability of Si_1-xC_x/Si strained layer superlattices
- - M.S. Goorsky
  - Subramanian S. Iyer
  - et al.
- 1992
- Applied Physics Letters
Preparation And Some Properties Of Sputtered Co/U-As Multilayers
- - T.S. Plaskett
  - P. Fumagalli
  - et al.
- 1992
- IEEE Transactions on Magnetics
Epitaxy of (100) Cu on (100) Si by evaporation near room temperatures: In-plane epitaxial relation and channeling analysis
- - Chin-An Chang
  - Joyce C. Liu
  - et al.
- 1990
- Applied Physics Letters
Crystallization kinetics of amorphous NiSi_x films
- - R.D. Thompson
  - J. Angilello
  - et al.
- 1990
- Thin Solid Films