Publications

11 results for William N. Hammer

A technique for measuring, displaying, recording, and modifying the spatial uniformity of implanted ions
- - W.N. Hammer
  - Alwin E. Michel
- 2008
- Journal of Applied Physics
Oxidation mechanisms in WSi₂ thin films
- - S. Zirinsky
  - W.N. Hammer
  - et al.
- 2008
- Applied Physics Letters
Nucleation-controlled thin-film interactions: Some silicides
- - R.L. Anderson
  - J.E.E. Baglin
  - et al.
- 2008
- Applied Physics Letters
The interaction process for Ag-Al polycrystalline thin-film couples
- - J.E.E. Baglin
  - F.M. D'Heurle
  - et al.
- 2008
- Journal of Applied Physics
Formation of iridium silicides from Ir thin films on Si substrates
- - S. Petersson
  - J.E.E. Baglin
  - et al.
- 2008
- Journal of Applied Physics
The thin-film formation of rhodium silicides
- - S. Petersson
  - R.L. Anderson
  - et al.
- 2008
- Journal of Applied Physics
Shallow silicide contact
- - K.N. Tu
  - W.N. Hammer
  - et al.
- 2008
- Journal of Applied Physics
Graded-index AR surfaces produced by ion implantation on plastic materials
- - E. Spiller
  - I. Hailer
  - et al.
- 1980
- Applied Optics
An interface - marker technique applied to the study of metal silicide growth
- - J.E.E. Baglin
  - F.M. D'Heurle
  - et al.
- 1980
- Nuclear Instruments and Methods
The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment
- - J.E.E. Baglin
  - J. Dempsey
  - et al.
- 1979
- Journal of Electronic Materials