Publications

24 results for M. McManus

An advanced optical diagnostic technique of IBM z990 eServer microprocessor
- - Peilin Song
  - Franco Stellari
  - et al.
- 2005
- IEEE ITC 2005
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis
- - Franco Stellari
  - Alan J. Weger
  - et al.
- 2004
- ESSDERC/ESSCIRC 2004
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- - Franco Stellari
  - Peilin Song
  - et al.
- 2004
- IEEE Transactions on Electron Devices
I/O interface latchup analysis using optical and electrical testing
- - Franco Stellari
  - Peilin Song
  - et al.
- 2004
- Electronic Device Failure Analysis
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- IEEE ITC 2003
Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- ISTFA 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- ISTFA 2003
Latchup Analysis Using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- Microelectronics Reliability