Conference paper
Automated mapping of very large areas of vlsi circuit using sil
Chung Ching Lin, Franco Stellari
ISTFA 2014
In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others. © 2004 IEEE.
Chung Ching Lin, Franco Stellari
ISTFA 2014
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ISTFA 2011