Jeff Gambino, Timothy D. Sullivan, et al.
MRS Spring Meeting 2007
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Jeff Gambino, Timothy D. Sullivan, et al.
MRS Spring Meeting 2007
Jeng-Bang Yau, Michael S. Gordon, et al.
VLSI-TSA 2011
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
Mihail P. Petkov, Marc H. Weber, et al.
Applied Physics Letters