Ali Khakifirooz, Kangguo Cheng, et al.
ISSCC 2010
Limitations of conventional strain engineering methods for fully-depleted SOI structure are reviewed and methods to extend these approaches to future FDSOI devices are discussed. The application of global strain engineering combined with biaxial to uniaxial strain conversion is shown to be promising. Finally, methods to utilize oxidation-induced strain engineering are introduced. ©The Electrochemical Society.
Ali Khakifirooz, Kangguo Cheng, et al.
ISSCC 2010
Ning Li, Stephen Bedell, et al.
SID International Symposium 2013
Veeraraghvan S. Basker, Theodorus E. Standaert, et al.
VLSI Technology 2010
X. Yang, Kingsuk Maitra, et al.
IEEE International SOI Conference 2011