Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
This paper compares the major classes of chip-to-chip and on-chips interconnections used in high-performance computers and communication systems and reviews their electrical characteristics. Measurement results of dielectric loss are shown and the attenuation is compared for printed-circuit-board, glass-ceramic, thin-film, and on-chip wiring. Simulation results are shown with representative driver and receiver circuits, guide-lines are given for when losses are significant, and predictions are made for the sustainable bandwidths on useful wiring lengths.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Kenneth R. Carter, Robert D. Miller, et al.
Macromolecules
Ellen J. Yoffa, David Adler
Physical Review B
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science