Publications

136 results at IEEE Transactions on Electron Devices

A Unified TDDB Model for BEOL Dielectrics of Various Structures and Thick FEOL Dielectrics
- - Kenji Okada
  - Kei Date
  - et al.
- 2024
- IEEE Transactions on Electron Devices
Simulation and Fabrication of Monolithic III-V Photodetectors on Si: The Role of Growth Facets and Localization of Heterojunctions
- - Cristina Martinez-Oliver
  - Markus Scherrer
  - et al.
- 2024
- IEEE Transactions on Electron Devices
Improved Air Spacer for Highly Scaled CMOS Technology
- - Kangguo Cheng
  - Chanro Park
  - et al.
- 2020
- IEEE Transactions on Electron Devices
Band-edge high-performance metal-gate/high-κ nMOSFET using Hf-Si/HfO ₂ stack
- - Takashi Ando
  - Tomoyuki Hirano
  - et al.
- 2009
- IEEE Transactions on Electron Devices
Impact of lateral asymmetric channel doping on 45-nm-technology N-Type SOI MOSFETs
- - Hasan M. Nayfeh
  - Nivo Rovedo
  - et al.
- 2009
- IEEE Transactions on Electron Devices
TCAD/physics-based analysis of high-density dual-BOX FD/SOI SRAM cell with improved stability
- - Keunwoo Kim
  - Jente B. Kuang
  - et al.
- 2009
- IEEE Transactions on Electron Devices
Measurement of subnanosecond delay through multiwall carbon-nanotube local interconnects in a CMOS integrated circuit
- - Gael F. Close
  - Shinichi Yasuda
  - et al.
- 2009
- IEEE Transactions on Electron Devices
Undoped-body extremely thin SOI MOSFETs with back gates
- - Amlan Majumdar
  - Zhibin Ren
  - et al.
- 2009
- IEEE Transactions on Electron Devices
Modeling and analysis of parasitic resistance in double-gate FinFETs
- - Daniel Tekleab
  - S. Samavedam
  - et al.
- 2009
- IEEE Transactions on Electron Devices
A simple semiempirical short-channel MOSFET current-voltage model continuous across all regions of operation and employing only physical parameters
- - Ali Khakifirooz
  - Osama M. Nayfeh
  - et al.
- 2009
- IEEE Transactions on Electron Devices