Hardware-assisted 3D TCAD for predictive capacitance extraction in 32nm SOI SRAMs
- Ajay N. Bhoj
- Rajiv Joshi
- et al.
- 2011
- IEDM 2011
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23 results at IEDM 2011
Assessment of fully-depleted planar CMOS for low power complex circuit operation
- Zhibin Ren
- S. Mehta
- et al.
- 2011
- IEDM 2011
Evaluation methodology for random telegraph noise effects in SRAM arrays
- M. Yamaoka
- Hiroshi Miki
- et al.
- 2011
- IEDM 2011
Record high RF performance for epitaxial graphene transistors
- Yanqing Wu
- Damon Farmer
- et al.
- 2011
- IEDM 2011
New layout dependency in high-k/metal gate MOSFETs
- M. Hamaguchi
- Deleep R. Nair
- et al.
- 2011
- IEDM 2011
High device yield carbon nanotube NFETs for high-performance logic applications
- Davood Shahrjerdi
- Aaron D. Franklin
- et al.
- 2011
- IEDM 2011
A low power phase change memory using thermally confined TaN/TiN bottom electrode
- J.Y. Wu
- Matthew Breitwisch
- et al.
- 2011
- IEDM 2011
Explore physical origins of resistance drift in phase change memory and its implication for drift-insensitive materials
- Jing Li
- Binquan Luan
- et al.
- 2011
- IEDM 2011
Chip-level power-performance optimization through thermally-driven across-chip variation (ACV) reduction
- X. Yu
- Oleg Gluschenkov
- et al.
- 2011
- IEDM 2011
Impact of TDDB in MG/HK devices on circuit functionality in advanced CMOS technologies
- Andreas Kerber
- D. Lipp
- et al.
- 2011
- IEDM 2011