STRUCTURAL CHARACTERISTICS OF CHEMISORBED LEAD ON SINGLE CRYSTAL COPPER SURFACES.
- D.L. Rath
- Dieter M. Kolb
- et al.
- 1983
- ECS Meeting 1983
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22 results at ECS Meeting 1983
STUDY OF SILICON CONTAMINATION AND NEAR-SURFACE DAMAGE CAUSED BY CF//4/H//2 REACTIVE ION ETCHING.
- G.S. Oehrlein
- R.M. Tromp
- et al.
- 1983
- ECS Meeting 1983
IN SITU DOPED SILICON VIA LPCVD: INTERACTIONS OF THE DOPANT/SILANE/SILICON SURFACE SYSTEM.
- B.S. Meyerson
- M.L. Yu
- 1983
- ECS Meeting 1983
SENSITIVE MASS MEASUREMENT AT THE METAL/LIQUID INTERFACE.
- K.K. Kanazawa
- Owen R. Melroy
- et al.
- 1983
- ECS Meeting 1983
PROPERTIES OF AMORPHOUS TANTALUM PENTOXIDE THIN FILMS ON SILICON.
- G.S. Oehrlein
- 1983
- ECS Meeting 1983
ADSORPTION OF CN** minus ON VARIOUS METAL ELECTRODES AS SEEN BY POLARIZATION MODULATED FT IRRAS.
- H. Seki
- K. Kunimatsu
- et al.
- 1983
- ECS Meeting 1983
AMBIENT GAS EFFECTS ON THE REACTION OF TITANIUM WITH SILICON.
- Subramanian S. Iyer
- C.-Y. Ting
- et al.
- 1983
- ECS Meeting 1983
ELECTRODE/ELECTROLYTE INTERPHASE STUDY USING POLARIZATION MODULATED FTIR REFLECTION ABSORPTION SPECTROSCOPY.
- K. Kunimatsu
- H. Seki
- et al.
- 1983
- ECS Meeting 1983
POINT DEFECTS AND DIFFUSION PROCESSES IN SILICON.
- T.Y. Tan
- U. Gosele
- 1983
- ECS Meeting 1983
EFFECT OF CONTACTS ON ADVANCED BIPOLAR DEVICE CHARACTERISTICS.
- T.H. Ning
- 1983
- ECS Meeting 1983