Multi-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Publications
4 results at IRPS 2008
Line edge roughness and spacing effect on low-k TDDB characteristics
- F. Chen
- J.R. Lloyd
- et al.
- 2008
- IRPS 2008
On-chip circuit for monitoring frequency degradation due to NBTI
- Kevin Stawiasz
- Keith A. Jenkins
- et al.
- 2008
- IRPS 2008
A multi-bit error detection scheme for DRAM using partial sums with parallel counters
- Balaji Narasimham
- Wing K. Luk
- 2008
- IRPS 2008