Impact ionization MOS (I-MOS) - Part II : Experimental results
- Kailash Gopalakrishnan
- Raymond Woo
- et al.
- 2005
- IEEE Transactions on Electron Devices
Publications
139 results at IEEE Transactions on Electron Devices
Impact ionization MOS (I-MOS) - Part I : Device and circuit simulations
- Kailash Gopalakrishnan
- Peter B. Griffin
- et al.
- 2005
- IEEE Transactions on Electron Devices
Impact of ion implantation damage and thermal budget on mobility enhancement in strained-Si N-channel MOSFETs
- Guangrui Xia
- Hasan M. Nayfeh
- et al.
- 2004
- IEEE Transactions on Electron Devices
Fabrication of metal gated FinFETs through complete gate silicidation with Ni
- Jakub Kedzierski
- Meikei Ieong
- et al.
- 2004
- IEEE Transactions on Electron Devices
Improved hot-electron reliability in strained-Si nMOS
- David Onsongo
- David Q. Kelly
- et al.
- 2004
- IEEE Transactions on Electron Devices
CMOS circuit performance enhancement by surface orientation optimization
- Leland Chang
- Meikei Ieong
- et al.
- 2004
- IEEE Transactions on Electron Devices
Double gate-MOSFET subthreshold circuit for ultralow power applications
- Jae-Joon Kim
- Kaushik Roy
- 2004
- IEEE Transactions on Electron Devices
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2004
- IEEE Transactions on Electron Devices
SODEL FET: Novel channel and source/drain profile engineering schemes by selective Si epitaxial growth technology
- Satoshi Inaba
- Kiyotaka Miyano
- et al.
- 2004
- IEEE Transactions on Electron Devices
A general approach for the performance assessment of nanoscale silicon FETs
- Jing Wang
- Paul M. Solomon
- et al.
- 2004
- IEEE Transactions on Electron Devices