On-chip antennas in silicon ICs and their application
- K.O. Kenneth
- Kihong Kim
- et al.
- 2005
- IEEE Transactions on Electron Devices
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134 results at IEEE Transactions on Electron Devices
Reverse active mode current characteristics of SiGe HBTs
- Jae-Sung Rieh
- Jin Cai
- et al.
- 2005
- IEEE Transactions on Electron Devices
Leakage power analysis of 25-nm double-gate CMOS devices and circuits
- Keunwoo Kim
- Koushik K. Das
- et al.
- 2005
- IEEE Transactions on Electron Devices
Quantum-based simulation analysis of scaling in ultrathin body device structures
- Arvind Kumar
- Jakub Kedzierski
- et al.
- 2005
- IEEE Transactions on Electron Devices
Threshold voltage control in NiSi-Gated MOSFETs through SIIS
- Jakub Kedzierski
- Diane Boyd
- et al.
- 2005
- IEEE Transactions on Electron Devices
Impact ionization MOS (I-MOS) - Part I : Device and circuit simulations
- Kailash Gopalakrishnan
- Peter B. Griffin
- et al.
- 2005
- IEEE Transactions on Electron Devices
Impact ionization MOS (I-MOS) - Part II : Experimental results
- Kailash Gopalakrishnan
- Raymond Woo
- et al.
- 2005
- IEEE Transactions on Electron Devices
Impact of ion implantation damage and thermal budget on mobility enhancement in strained-Si N-channel MOSFETs
- Guangrui Xia
- Hasan M. Nayfeh
- et al.
- 2004
- IEEE Transactions on Electron Devices
Improved hot-electron reliability in strained-Si nMOS
- David Onsongo
- David Q. Kelly
- et al.
- 2004
- IEEE Transactions on Electron Devices
Fabrication of metal gated FinFETs through complete gate silicidation with Ni
- Jakub Kedzierski
- Meikei Ieong
- et al.
- 2004
- IEEE Transactions on Electron Devices