Interpretation of the x-ray photoemission spectra of cobalt oxides and cobalt oxide surfaces
- T.J. Chuang
- C.R. Brundle
- et al.
- 1976
- Surface Science
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Practical limitations to accuracy in a nulling automatic wavelength-scanning ellipsometer
- A.C. Lowe
- 1976
- Surface Science
Deconvolution method for composition profiling by Auger sputtering technique
- P.S. Ho
- J.E. Lewis
- 1976
- Surface Science
Hydrogen induced interfacial polarization at PdSiO2 interfaces
- Ingemar Lundström
- Thomas DiStefano
- 1976
- Surface Science
Surface crystallography of the c(2×2) sodium overlayer on Al(100)
- B.A. Hutchins
- T.N. Rhodin
- et al.
- 1976
- Surface Science
Generalized rotating-compensator ellipsometry
- P.S. Hauge
- 1976
- Surface Science
Comment on the use of "Kramers-kronig analysis for the determination of the optical constants of thin surface films" by K. Naegele and W.J. Plieth
- Jean Horkans
- 1976
- Surface Science
Core- and valence-electron spectra of clean Si surfaces by energy loss spectroscopy
- A Koma
- R Ludeke
- 1976
- Surface Science
Cluster model calculations for electronic energy levels of oxygen chemisorbed on Ni
- I.P. Batra
- O. Robaux
- 1975
- Surface Science
The structure of overlayers. III. Nitrogen on Mo {001}
- A. Ignatiev
- F. Jona
- et al.
- 1975
- Surface Science