Semiconductor superfine structures by computer-controlled molecular beam epitaxyL. EsakiL.L. Chang1976Thin Solid Films
Oxide-charge-induced impurity band in silicon inversion layersA. HartsteinA.B. Fowler1976Surface Science
Electron scattering in silicon inversion layers by oxide and surface roughnessA. HartsteinT.H. Ninget al.1976Surface Science
Screening and level broadening in inversion layers with random fixed chargesFrank Stern1976Surface Science
Recent progress in electronic properties of quasi-two-dimensional systemsFrank Stern1976Surface Science
Many-body effects in the first excited subband of the n-inversion layer of SiB. VinterFrank Stern1976Surface Science
Some dynamical properties of a two-dimensional Wigner crystalLynn BonsallA.A. Maradudin1976Surface Science
Cluster model calculation and photoemission studies of molecularly adsorbed NO on NiI.P BatraC.R Brundle1976Surface Science
Use of misfit strain to remove dislocations from epitaxial thin filmsJ.W. MatthewsA.E. Blakesleeet al.1976Thin Solid Films