A Device Model for Buried-Channel CCD's and MOSFET's with Gaussian Impurity Profiles
- Pallab K. Chatterjee
- Geoffrey W. Taylor
- et al.
- 1980
- IEEE T-ED
Publications
465 results at IEEE T-ED
Niobium Oxide-Barrier Tunnel Junction
- Stanley I. Raider
- Robert E. Drake
- et al.
- 1980
- IEEE T-ED
Dependence of Electroluminescence Efficiency and Memory Effect on Mn Concentration in ZnS: Mn ACTEL Devices
- V. Marrello
- Aare Onton
- 1980
- IEEE T-ED
A Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
Simulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
TA-A3 Retention Time Studies in Buried-Channel MOSFET Dynamic-Memory Devices
- H.H. Chao
- R.P. Havreluk
- 1980
- IEEE T-ED
Effects of Impurity Compensation on Injection Current in Si Bipolar Transistors
- D.D. Tang
- Alwin E. Michel
- 1980
- IEEE T-ED
Josephson-Logic Devices and Circuits
- Tushar R. Gheewala
- 1980
- IEEE T-ED
Efficiency Calculations for Thin-Film Polycrystalline Semiconductor p-n Junction Solar Cells
- Conrad Lanza
- Harold J. Hovel
- 1980
- IEEE T-ED
Effect of Emitter Contact on Current Gain of Silicon Bipolar Devices
- Tak H. Ning
- Randall D. Isaac
- 1980
- IEEE T-ED