PaperSi film electrical characterization in SOI substrates by the HgFET techniqueH.J. HovelSolid-State Electronics
PaperInterfacial microstructure of tungsten silicide Schottky contacts to n-type GaAsYih-Cheng Shih, A.C. Callegari, et al.Journal of Applied Physics
Conference paperMaterial development of SIMOX with a thin boxD.K. Sadana, H.J. Hovel, et al.IEEE International SOI Conference 1993