Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry
- C.R. Brundle
- 1980
- Thin Solid Films
Publications
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- Materials Discovery
3485 results for Materials Discovery
Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry
- P.S. Hauge
- R.H. Muller
- et al.
- 1980
- Surface Science
Electronic properties of InAsGaSb superlattices
- L.L. Chang
- L. Esaki
- 1980
- Surface Science
Raman spectra of molecules on metal surfaces
- A. Girlando
- J.G. Gordon II
- et al.
- 1980
- Surface Science
Hills or hollows? — An ambiguity in the determination of surface corrugation
- K.H. Rieder
- A. Baratoff
- et al.
- 1980
- Surface Science
Application of the generalized mean spherical approximation to the electric double layer
- Douglas Henderson
- Lesser Blum
- 1980
- Surface Science
On the kinetic energies of sputtered excited particles: II. Theory and applications to group IIA fluorides
- Steven Dzioba
- Roger Kelly
- 1980
- Surface Science
The influence of ion sputtering on the elemental analysis of solid surfaces
- J.W. Coburn
- 1979
- Thin Solid Films
Secondary-ion emission from silicon bombarded with atomic and molecular noble-gas ions
- K. Wittmaack
- 1979
- Surface Science
A molecular-beam investigation of the reaction H2 + 1 2O2 → H2O on Pd(111)
- T. Engel
- H. Kuipers
- 1979
- Surface Science