Summary Abstract: Modification of metals by low energy ions during thin film depositionJ.M.E. HaroerJ.J. Cuomo1985JVSTA
Summary Abstract: Titanium silicide films prepared by reactive sputteringV. DelineF.M. d’Heurle1985JVSTA
High resolution photoemission investigation: The oxidation of WGuy HollingerF.J. HimDselet al.1985JVSTA
Summary Abstract: The origin of oxidation induced enhancement of Si+ sputter yield in SIMSD.J. VitkavageJ.G. Clabeset al.1985JVSTA
Effects of biased cosputtering on resistivity and step coverage in tungsten silicide filmsK.W. ChoiK.Y. Ahn1985JVSTA
Properties and Microelectronic Applications of Thin Films of Refractory Metal NitridesMarc Wittmer1985JVSTA
Reactive sputtering of copper and silicon near the sputtering thresholdT.M. MayerJ.M.E. Harperet al.1985JVSTA